Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/10946
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dc.contributor.authorReddy, O. Yugeswar-
dc.contributor.authorChatterjee, Soumesh-
dc.contributor.authorChakraborty, Ajoy Kumar-
dc.date.accessioned2022-03-12T06:14:45Z-
dc.date.available2022-03-12T06:14:45Z-
dc.date.issued2022-
dc.identifier.urihttp://10.1.7.192:80/jspui/handle/123456789/10946-
dc.description.abstractDC microgrids (DCMGs) are gaining popularity mainly in shipboards and isolated power systems for their modest control and higher efficiency. However, the newer conception and less literature are forcing the operators to take up tough challenges for smoother operation of the overall system. Protection areas of DCMGs are still immature because of the inexperience of handling DC faults and less availability of DC circuit breakers (DCCBs) in outsized range. In this work, the fault detection and classification issue in low-voltage-DC-microgrid (LVDCMG) has been solved with a bilayered machine learning scheme based on weighted K-nearest neighbor (WKNN) and decision tree (DT). WKNN accurately detects the fault in the line, and DT classifies the fault as PG or PP for further corrective measures. The developed technique has been implemented in an LVDCMG with PV and battery energy sources. Voltage and current measurements from the network have been used as training samples to the classifier models. It has been noticed that the proposed bilayered protection scheme is giving 100% detection accuracy. The outcome of the proposed structure seems to be promising and has been compared with some of the existing machine learning (ML)-based fault detection techniques for microgrids (MGs).en_US
dc.publisherTaylor and Francisen_US
dc.subjectFault detectionen_US
dc.subjectfault classificationen_US
dc.subjectweighted K-nearest neighbor (WKNN)en_US
dc.subjectdecision tree (DT)en_US
dc.subjectlow-voltage-DC-microgrid (LVDCMG)en_US
dc.titleBilayered fault detection and classification scheme for low-voltage DC microgrid with weighted KNN and decision treeen_US
dc.typeFaculty Papersen_US
Appears in Collections:Faculty Papers, EE

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