Automation of Reliability analysis for Differential Amplifier at various aging requirements

Abstract

Operational amplifiers (op-amp) are highly demand for most of the applications such as in medical and communication system. we all know that Semiconductor devices get age over time, but what is not often well under-stood are the mechanisms for aging and the limits of aging that will cause a chip becomes fail. Specially circuit reliability is very challenging because to aging.

An efficient and effective approach is developed a bridge for reliability analysis to the gap between device level reliability and product level reliability. Continuous reduction of gate-oxide, device dimensions and increase in channel doping introducing most of the reliability concerns which results inincreased electric field. The most important reliability issues impacting circuit design are bias temperature in stability hot carrier injection and time dependent dielectric breakdown.

This Project aims at enabling automation for reliability analysis of diff-amp in Process design kits. PDK includes all set of files which helps designers to fabricate these IC circuit design to the foundry. Automation reduced the time, effort and make this analysis simple. It also shows the clear picture of Standalone based setup and automated reliability analysis and its results. In Standalone based setup-based reliability analysis of diff-amp is implemented and operated at 1.8 V supply voltage and discuss the aging effect on drain current and threshold voltage with performance parameters such as: gain, phase margin, GBW (Gain Bandwidth Product). The result shows that com- parison between fresh and aged outputs.