Please use this identifier to cite or link to this item:
http://10.1.7.192:80/jspui/handle/123456789/12406
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Dave, Harsh | - |
dc.date.accessioned | 2024-07-31T08:21:17Z | - |
dc.date.available | 2024-07-31T08:21:17Z | - |
dc.date.issued | 2024-06-01 | - |
dc.identifier.uri | http://10.1.7.192:80/jspui/handle/123456789/12406 | - |
dc.description.abstract | In modern System-on-Chip (SoC) design, the validation of DDR PHY (Physical Layer) training sequences is a critical step to ensure reliable high-speed memory interfaces. This thesis presents a hybrid validation framework for DDR PHY training sequences in a pre-silicon environment, utilizing a combination of SystemC models and RTL (Register Transfer Level) implementations. Specifically, the framework integrates a SystemC model of the SoC with an RTL representation of the Universal Memory Controller (UMC) and PHY components. The proposed methodology leverages the high-level abstraction and simulation speed of SystemC for the SoC model while maintaining the cycle accuracy and detailed timing characteristics of RTL for the UMC and PHY. This hybrid approach facilitates comprehensive validation by enabling early software development and system-level testing alongside detailed hardware verification. ey aspects of the validation process include the configuration and control of the DDR PHY via the Advanced Peripheral Bus (APB), with a focus on dynamic parameter adjustment during training sequences such as read leveling, write leveling, and data eye training. The framework’s efficacy is demonstrated through extensive simulation scenarios, highlighting improvements in timing accuracy, signal integrity, and power efficiency. | en_US |
dc.publisher | Institute of Technology | en_US |
dc.relation.ispartofseries | 22MECV05; | - |
dc.subject | EC 2022 | en_US |
dc.subject | Project Report | en_US |
dc.subject | Project Report 2022 | en_US |
dc.subject | EC Project Report | en_US |
dc.subject | EC (VLSI) | en_US |
dc.subject | VLSI | en_US |
dc.subject | VLSI 2022 | en_US |
dc.subject | 22MEC | en_US |
dc.subject | 22MECV | en_US |
dc.subject | 22MECV05 | en_US |
dc.title | Hybrid Validation of DDR-PHY | en_US |
dc.type | Dissertation | en_US |
Appears in Collections: | Dissertation, EC (VLSI) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
22MECV05.pdf | 22MECV05 | 1.78 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.