Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/12406
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dc.contributor.authorDave, Harsh-
dc.date.accessioned2024-07-31T08:21:17Z-
dc.date.available2024-07-31T08:21:17Z-
dc.date.issued2024-06-01-
dc.identifier.urihttp://10.1.7.192:80/jspui/handle/123456789/12406-
dc.description.abstractIn modern System-on-Chip (SoC) design, the validation of DDR PHY (Physical Layer) training sequences is a critical step to ensure reliable high-speed memory interfaces. This thesis presents a hybrid validation framework for DDR PHY training sequences in a pre-silicon environment, utilizing a combination of SystemC models and RTL (Register Transfer Level) implementations. Specifically, the framework integrates a SystemC model of the SoC with an RTL representation of the Universal Memory Controller (UMC) and PHY components. The proposed methodology leverages the high-level abstraction and simulation speed of SystemC for the SoC model while maintaining the cycle accuracy and detailed timing characteristics of RTL for the UMC and PHY. This hybrid approach facilitates comprehensive validation by enabling early software development and system-level testing alongside detailed hardware verification. ey aspects of the validation process include the configuration and control of the DDR PHY via the Advanced Peripheral Bus (APB), with a focus on dynamic parameter adjustment during training sequences such as read leveling, write leveling, and data eye training. The framework’s efficacy is demonstrated through extensive simulation scenarios, highlighting improvements in timing accuracy, signal integrity, and power efficiency.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries22MECV05;-
dc.subjectEC 2022en_US
dc.subjectProject Reporten_US
dc.subjectProject Report 2022en_US
dc.subjectEC Project Reporten_US
dc.subjectEC (VLSI)en_US
dc.subjectVLSIen_US
dc.subjectVLSI 2022en_US
dc.subject22MECen_US
dc.subject22MECVen_US
dc.subject22MECV05en_US
dc.titleHybrid Validation of DDR-PHYen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EC (VLSI)

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