Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/3094
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dc.contributor.authorZaveri, Tanish-
dc.contributor.authorMakwana, Ishit-
dc.contributor.authorZaveri, Mukesh-
dc.date.accessioned2012-04-12T09:13:01Z-
dc.date.available2012-04-12T09:13:01Z-
dc.date.issued2011-12-08-
dc.identifier.citation2nd International Conference on Current Trends in Technology, NUiCONE-2011, Institute of Technology, Nirma University, December 8-10, 2011en_US
dc.identifier.isbn9788192304908-
dc.identifier.urihttp://10.1.7.181:1900/jspui/123456789/3094-
dc.description.abstractIn recent years, Pan sharpening methods are viewed as an effective tool to analyze multiband remote sensing images. In this paper a novel substitutive Pan sharpening method using PCA and contourlet transform is proposed. The proposed method provides novel tradeoff solution between the spectral and spatial fidelity and preserves more detail spectral and spatial information. Also, new substitution based image fusion rules are proposed. Proposed method is applied on registered Panchromatic and Multispectral images and simulation results are compared using standard image fusion parameters. The simulation results of proposed method also compared with four different standard Pan sharpening methods available in literature. It has been observed from simulation results that proposed algorithm preserves better spatial and spectral information and better visual quality compared to earlier reported methods.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseriesITFEC008-6en_US
dc.subjectMultispectralen_US
dc.subjectPanchromaticen_US
dc.subjectContourlet Transformen_US
dc.subjectPrincipal Component Analysisen_US
dc.subjectImage Fusionen_US
dc.subjectEC Faculty Paperen_US
dc.subjectFaculty Paperen_US
dc.subjectITFEC008en_US
dc.subjectNUiCONEen_US
dc.subjectNUiCONE-2011en_US
dc.titleNovel Substitution based Pan Sharpening Method Using Contourlet Transformen_US
dc.typeFaculty Papersen_US
Appears in Collections:Faculty Papers, EC

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