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DC Field | Value | Language |
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dc.contributor.author | Naik, Amisha | - |
dc.contributor.author | Devashrayee, N. M. | - |
dc.date.accessioned | 2012-05-12T09:27:03Z | - |
dc.date.available | 2012-05-12T09:27:03Z | - |
dc.date.issued | 2010-12-09 | - |
dc.identifier.citation | 1st International Conference on Current Trends in Technology, NUiCONE 2010, December 9-11, 2010, Institute of Technology, Nirma University, Ahmedabad | en_US |
dc.identifier.uri | http://10.1.7.181:1900/jspui/123456789/3211 | - |
dc.description.abstract | Parameter variation in scaled technologies beyond 100nm will pose a major challenge for design of future high performance Chips. In this paper, we discuss process, voltage and temperature variations; and their impact on OTA based CCII circuit.To analyze the effect of these parameters , Monte-Carlo simulation is carried out. The external parameters like supply voltage ,temperature and process parameters like oxide thickness, channel length -width and threshold voltage is varied by +/-5% .The simulation results are studied and tabulated which shows maximum 6.67% variation in the ratio Vx/Vy , Iz/Ix and node impedances. | en_US |
dc.publisher | Institute of Technology | en_US |
dc.relation.ispartofseries | ITFEC007-2 | en_US |
dc.subject | Second Generation Current Conveyor (CCII) | en_US |
dc.subject | Process Variation | en_US |
dc.subject | Monte-Carlo Simulation | en_US |
dc.subject | EC Faculty Paper | en_US |
dc.subject | Faculty Paper | en_US |
dc.subject | ITFEC007 | en_US |
dc.subject | ITFEC006 | en_US |
dc.subject | NUiCONE | en_US |
dc.subject | NUiCONE-2010 | en_US |
dc.title | Effect of Parameter Variation on OTA based Second Generation Current conveyor (CCII) | en_US |
dc.type | Faculty Papers | en_US |
Appears in Collections: | Faculty Papers, EC |
Files in This Item:
File | Description | Size | Format | |
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ITFEC007-2.pdf | ITFEC007-2 | 350.79 kB | Adobe PDF | ![]() View/Open |
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