Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/3211
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dc.contributor.authorNaik, Amisha-
dc.contributor.authorDevashrayee, N. M.-
dc.date.accessioned2012-05-12T09:27:03Z-
dc.date.available2012-05-12T09:27:03Z-
dc.date.issued2010-12-09-
dc.identifier.citation1st International Conference on Current Trends in Technology, NUiCONE 2010, December 9-11, 2010, Institute of Technology, Nirma University, Ahmedabaden_US
dc.identifier.urihttp://10.1.7.181:1900/jspui/123456789/3211-
dc.description.abstractParameter variation in scaled technologies beyond 100nm will pose a major challenge for design of future high performance Chips. In this paper, we discuss process, voltage and temperature variations; and their impact on OTA based CCII circuit.To analyze the effect of these parameters , Monte-Carlo simulation is carried out. The external parameters like supply voltage ,temperature and process parameters like oxide thickness, channel length -width and threshold voltage is varied by +/-5% .The simulation results are studied and tabulated which shows maximum 6.67% variation in the ratio Vx/Vy , Iz/Ix and node impedances.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseriesITFEC007-2en_US
dc.subjectSecond Generation Current Conveyor (CCII)en_US
dc.subjectProcess Variationen_US
dc.subjectMonte-Carlo Simulationen_US
dc.subjectEC Faculty Paperen_US
dc.subjectFaculty Paperen_US
dc.subjectITFEC007en_US
dc.subjectITFEC006en_US
dc.subjectNUiCONEen_US
dc.subjectNUiCONE-2010en_US
dc.titleEffect of Parameter Variation on OTA based Second Generation Current conveyor (CCII)en_US
dc.typeFaculty Papersen_US
Appears in Collections:Faculty Papers, EC

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