Analysis of Test Data Compression Methods Using Huffman Codes

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DC Field	Value	Language
dc.contributor.author	Bhavsar, Kinjal A.	-
dc.contributor.author	Mehta, Usha	-
dc.date.accessioned	2012-05-12T09:59:41Z	-
dc.date.available	2012-05-12T09:59:41Z	-
dc.date.issued	2010-12-09	-
dc.identifier.citation	1st International Conference on Current Trends in Technology, NUiCONE 2010, December 9-11, 2010, Institute of Technology, Nirma University, Ahmedabad	en_US
dc.identifier.uri	http://10.1.7.181:1900/jspui/123456789/3212	-
dc.description.abstract	This paper presents a compression scheme based on various Huffman coding like selective and optimal Huffman for reducing the amount of test data that must be stored on a tester and transferred to each core in a system-on-a-chip (SOC) during manufacturing test .Results indicate that the using Huffman coding compression ratio high but it required high hardware overhead .In selective Huffman coding reduces decoder size by slightly sacrificing compression ratio. In optimal selective maximize compression ratio	en_US
dc.publisher	Institute of Technology	en_US
dc.relation.ispartofseries	ITFEC010-9	en_US
dc.subject	EC Faculty Paper	en_US
dc.subject	Faculty Paper	en_US
dc.subject	ITFEC010	en_US
dc.subject	NUiCONE	en_US
dc.subject	NUiCONE-2010	en_US
dc.title	Analysis of Test Data Compression Methods Using Huffman Codes	en_US
dc.type	Faculty Papers	en_US
Appears in Collections:	Faculty Papers, EC

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