Design & Analysis of SRAM Memory Compiler & its Characterisation

Abstract

This Project Report explores the Analysis, Post-Layout Extraction, Set-up development, Design-validations and Cut-Generation of Single port Static Random Access Memories (SRAM) & Read only memory (ROM) with 90 nanometer three Metal layer Technology. The SRAM characterization includes various measurements like timings & capacitances. Validation includes the analysis of performance aspects of Memory Cell, Verification of functionality by applying Tight Stimuli which is generated by timing values, Marginality Analysis; Write through Analysis, Power-On Reset Analysis, Sense-Amp-Offset Analysis, Self-time Read Analysis, Self-time Write Analysis, Latch Analysis, Sense-Pulse-Width Analysis. CUT generation is done for providing the Specification of a memory cut through a Graphical User Interface on WebGen. I investigate the methodology of characterization of the parameters and validation of functionality.