Design Simulation And Characterisation Of Op-Amp Based 3 Bit R-2r Segmented Dacs

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DC Field	Value	Language
dc.contributor.author	Soni, Rajanikant	-
dc.contributor.author	Amin, Gireeja	-
dc.contributor.author	Devashrayee, N. M.	-
dc.contributor.author	Mehta, Usha	-
dc.date.accessioned	2014-12-09T09:07:21Z	-
dc.date.available	2014-12-09T09:07:21Z	-
dc.date.issued	2012-04	-
dc.identifier.issn	0974-3596	-
dc.identifier.uri	http://hdl.handle.net/123456789/5234	-
dc.description	International Journal Of Computer Applications In Engineering, Technology And Sciences (IJ-CA-ETS), Vol. 4 (2), April -September, 2012, Page No. 200 - 204	en_US
dc.description.abstract	This paper presents a study on a digitally calibrated DAC, based on a strictly R-2R topology with operational amplifier which is able to derive high resolution - high performance DACs, in terms of INL and DNL. It has been proven by simulations that the performance of the conventional R-2R DAC can be optimized, regardless of resistors tolerance and the DAC resolution.	en_US
dc.relation.ispartofseries	ITFEC006-9;	-
dc.subject	Digital To Analog Conversion	en_US
dc.subject	Resolution	en_US
dc.subject	Linearity	en_US
dc.subject	INL	en_US
dc.subject	DNL	en_US
dc.subject	Glitch	en_US
dc.subject	EC Faculty Paper	en_US
dc.subject	Faculty Paper	en_US
dc.subject	ITFEC006	en_US
dc.subject	ITFEC010	en_US
dc.title	Design Simulation And Characterisation Of Op-Amp Based 3 Bit R-2r Segmented Dacs	en_US
dc.type	Faculty Papers	en_US
Appears in Collections:	Faculty Papers, EC

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