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DC Field | Value | Language |
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dc.contributor.author | Thummar, Nileshkumar | - |
dc.date.accessioned | 2015-08-11T11:51:36Z | - |
dc.date.available | 2015-08-11T11:51:36Z | - |
dc.date.issued | 2015-06-01 | - |
dc.identifier.uri | http://hdl.handle.net/123456789/5979 | - |
dc.description.abstract | In an IP we have different views to support different flows. The views can be of broadly categorized in two types as the Front End views and Back End views. The Back End (BE) Views comprises of layout schematics and the symbols whereas the Front End (FE) views have information related to its characterization like the timings, delays, leakages and power, physical views like gds, cdl, adms, lef, SIP, ICPACK and much more. The FE views generated after the BE view becomes ready as all the information is derived from BE views with the help of some standard EDA tools and some other internal tools. The project implements new methodology for generating different FE views of IOs library without getting the information from the Back End. This involves developing a tool that can take the customized inputs giving all the options available to the user and produce the required FE views directly so that both the back-end as well as the front-end can work in parallel thus saving the time and help us in reducing time-to-market which is very important from company prospects. For the proper tool development, knowledge of the complete library flow as well as the language used for it is required. | en_US |
dc.publisher | Institute of Technology | en_US |
dc.relation.ispartofseries | 13MECV28; | - |
dc.subject | EC 2013 | en_US |
dc.subject | Project Report | en_US |
dc.subject | Project Report 2013 | en_US |
dc.subject | EC Project Report | en_US |
dc.subject | EC (VLSI) | en_US |
dc.subject | VLSI | en_US |
dc.subject | VLSI 2013 | en_US |
dc.subject | 13MEC | en_US |
dc.subject | 13MECV | en_US |
dc.subject | 13MECV28 | en_US |
dc.title | Physical View Generation and Validation of AMS IPS for the SOC Enablement | en_US |
dc.type | Dissertation | en_US |
Appears in Collections: | Dissertation, EC (VLSI) |
Files in This Item:
File | Description | Size | Format | |
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13MECV28.pdf | 13MECV28 | 1.57 MB | Adobe PDF | ![]() View/Open |
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