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dc.contributor.authorShah, Mitul K.-
dc.date.accessioned2017-08-09T07:20:04Z-
dc.date.available2017-08-09T07:20:04Z-
dc.date.issued2017-05-
dc.identifier.urihttp://hdl.handle.net/123456789/7649-
dc.description.abstractIn recent years, the increasing demands of an IGBT devices used in power electronic equipment due to their high power handling capability. IGBT devices play a large role in power applications due to their high current, voltage capability, and ease of driving. By increasing the switching speed it is possible to reduce the power dissipation, however, this, in turn, leads to fast current transitions that generate large amounts of electromagnetic interferences (EMI) over wide frequency ranges and increase over-current stress at turn-on, and over-voltage stress at turn-off. The challenge in gate driver design is to find solutions to the dilemma between the requirement to minimize switching losses and the requirement to limit electromagnetic interferences (EMI), peak reverse recovery current at turn-on, and voltage overshoot at turn-off.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries15MEEP22;-
dc.subjectElectrical 2017en_US
dc.subjectProject Report 2017en_US
dc.subjectElectrical Project Reporten_US
dc.subjectProject Reporten_US
dc.subjectEE (PEMD)en_US
dc.subjectPower Electronics, Machines  & Drivesen_US
dc.subject15MEEen_US
dc.subject15MEEPen_US
dc.subject15MEEP22en_US
dc.subjectPEMDen_US
dc.subjectPEMD 2017en_US
dc.titleSwitching Losses Optimized IGBT Gateen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EE (PEMD)

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