Please use this identifier to cite or link to this item:
http://10.1.7.192:80/jspui/handle/123456789/8358
Title: | Design of a Low Voltage, Low Power and High Speed CMOS Comparator |
Authors: | Savani, Vijay Gopalbhai |
Keywords: | Theses EC Theses Theses IT Dr. N. M. Devashraye 11EXTPHDE69 ITFEC024 ITFEC006 TT000069 |
Issue Date: | 2018 |
Publisher: | Institute of Technology |
Series/Report no.: | TT000069; |
Abstract: | Analog-to-digital converters (ADCs) and Digital-to-Analog converters (DACs) are key components of modern microelectronics applications where an interface between the analog world and the progressive digital signal processing world is needed. They are found in an extensive range of devices in consumer electronics, medical equipment, communication and instrumentation applications, and current growing areas (e.g. Internet of Things (IoT), all portable systems in today’s life, and wearable devices etc.) just to name a few. With the fast development of CMOS technology, more and more signal processing circuits and building blocks are implemented in the digital domain for lower cost, lower power consumption, high-speed, higher yield, and higher re-configurability. To minimize production steps and the cost of the final product, several functional circuit blocks are combined into one chip and form a System on a Chip (SoC). It is common to implement digital and analog blocks into one chip with additional ADCs or DACs. The basic building blocks of an ADCs and DACs consist of analog circuits such as voltage reference, operational amplifiers as well as mixed signal circuits such as comparators. The comparator is also known as 1-bit ADC and for that reason, it is mostly used in abundance in ADCs. Besides ADCs and DACs, the comparator has many other applications such as VLSI logic circuits, memory, relaxation oscillators, null detector, zero-crossing detectors, peak detectors, switching power regulators, high-speed wireless and wireline communication systems, and many more. This has generated a great demand for high-speed, low-power, and low-voltage comparator that can be realized in a mainstream deepsubmicron Complementary Metal Oxide Semiconductor (CMOS) technology. The requirement of bandwidth is also increasing day by day and almost all lower bands are already occupied. The design of ADCs and ultimately the comparator, which work on higher frequencies are needed in the modern world. The conversion speed of converter is restricted by the decision-making response time of the comparator. As the comparator is one of the blocks, which limits the speed of the converter, its optimization is of utmost importance. Not only the speed, but lower power with low supply voltage has emerged as a principal theme in today's electronics industry. Reduction of power consumption makes a device more reliable and efficient. As the scaling of CMOS technology continues, the supply voltage gets lower and it inherently limits the maximum input voltage swing. In ultra-deep sub-micron CMOS technology, the threshold voltage of the devices is not scaled down at the same rate as supply voltage and the technology. Hence, it presents many challenges and problem to design a comparator in sub-micron technology at low-supply voltage. The requirements have fostered research in two main areas to provide the solutions namely, technological solution and solution using architectural modification. The research in the thesis is focused on the second solution i.e. architectural modification. There are classically two types of comparators reported in the literature viz. continues time (without clock) and discrete time (clocked). The demanding need of ultra-high speed, area efficient and power optimized ADCs forces towards the exploration and usage of the clocked regenerative comparator to minimize the power, area and maximize the speed. In this research, a novel fully dynamic latched comparator with high-speed, low-power consumption and optimized die area compared to the conventional dynamic latch comparators is proposed. Design considerations for comparator are also discussed in the thesis. Based on the study, a new reset technique – shared charge logic, for the dynamic latched comparator is proposed. In this technique, a pass transistor is used in the latch stage to share the charge between two output terminals of the comparator during the reset phase. The simulation is carried out in 90nm CMOS technology using Virtuoso tool. Besides, proposed design the thesis provides a comprehensive review, analysis and implementation for a variety of conventional (traditional) dynamic latched comparator designs along with proposed comparator- in terms of speed, power, area, power delay product (PDP), and other performance parameters. Various parametric variations (viz. dependence on input commonmode voltage, input differential voltage, etc.) are also carried out and the results are presented for the proposed comparator along with the referred comparator. Systematic and random variations in process parameters, supply voltage, and temperature are posing a major challenge to the future high performance VLSI design. Using Monte Carlo simulations, the effect of process variation is studied. Also, systematic and random variations are observed using simulation results. With a supply voltage of 1 V, at 1 GHz of frequency, the proposed comparator results in a delay of 51.76 ps while consuming 32.62 μW of power. The proposed comparator has the lowest PDP and energy per conversion, which is 1.69 fJ and 32.6 fJ respectively. The comparator has less offset voltage as well as higher common-mode voltage range. It is less sensitive to input differential voltage variation for the delay (delay/log(ΔVdiff)). The percentage improvement in terms of delay for the proposed comparator is 63.02 %, 40.65 %, 40.46 %, and 44.51 % respectively as compared to the conventional (referred) comparators viz. single tail, double-tail, modified double-tail and two stage dynamic latched comparators. It is -13.24 %, 60.64 %, 372.41 %, and 75.35 % in terms of power consumption as compared to referred architectures respectively. The post layout results of all the comparators are also obtained. In 90nm CMOS technology, the proposed comparator provides the maximum sampling frequency of 3.9 GHz at the 1 V supply voltage. Finally, all the obtained results are compared with state of art architectures reported in the literature in terms of their performance parameters and Figure of Merit (FoM). The results demonstrate the potential of new proposed comparator architecture for high-speed, low-power, and lowvoltage applications. |
URI: | http://10.1.7.192:80/jspui/handle/123456789/8358 |
Appears in Collections: | Ph.D. Research Reports |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
TT000069.pdf | TT000069 | 21.59 MB | Adobe PDF | ![]() View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.