Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/8620
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dc.contributor.authorShah, Jignesh Pankaj-
dc.date.accessioned2019-08-06T05:06:04Z-
dc.date.available2019-08-06T05:06:04Z-
dc.date.issued2017-06-01-
dc.identifier.urihttp://10.1.7.192:80/jspui/handle/123456789/8620-
dc.description.abstractMCCBs are widely used as protection devices in industries. The main purpose of MCCB is to make, carry or break current under normal as well as under abnormal condition such that overload or short circuit. When fault occurs, arc is produced between the contacts. This will lead to material loss of contact system, which subsequently reduce the electrical life of the breaker. During calibration of breaker while manufacturing there will be some amount of material erosion. Existing 630A frame 3 MCCB uses AgNi as the lower contact button material and AgC as the upper contact button material. This existing contact button material will be analysed to realize the limitation and scope of material improvement. Based on the outcomes of detailed study and testing results, new material for the contact button will be selected. To overcome the erosion that is been seen during the testing of the breaker, appropriate changes within the breaker will be made. This objective will be achieved through completion of multiple small milestones such as theoretical validation, concept development, use of JMAG software for electromagnetic simulation, Pro-E software for 3D modelling of the proposed designs and validation testing of MCCBs made with proposed concepts.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries15MEEE22;-
dc.subjectElectrical 2015en_US
dc.subjectProject Report 2015en_US
dc.subjectElectrical Project Reporten_US
dc.subjectProject Reporten_US
dc.subject15MEEen_US
dc.subject15MEEEen_US
dc.subject15MEEE22en_US
dc.subjectEPSen_US
dc.subjectEPS 2015en_US
dc.subjectEE (EPS)en_US
dc.subjectElectrical Power Systemsen_US
dc.titleReduction in Contact Button Erosion of Frame3- 630 A MCCBen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EE (EPS)

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