Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/8885
Title: Voltage Stability Improvement using FACTS Devices
Authors: Patel, Krunal Amrutlal
Keywords: Electrical 2016
Project Report 2016
Electrical Project Report
Project Report
16MEE
16MEEE
16MEEE23
EPS
EPS 2016
EE (EPS)
Electrical Power Systems
Issue Date: 1-Jun-2019
Publisher: Institute of Technology
Series/Report no.: 16MEEE23;
Abstract: Electrical Power system is confronting few new difficulties now days as the present system is threaten to several stressed conditions. Voltage strength is very imperative issue of electrical power system which can reduce the power system performance under such intractable condition. To intercept the blackouts voltage stability of the system must be examined for an extensive variety of working conditions. Target of this work is to determine the critical bus utilizing a few voltage stability analysis methods and executing the FACTS devices to recover the voltage stability on IEEE-14 bus system. The proposed work introduces an approach to analyze the voltage stability of the system and finding out the particular stressed bus/line as an optimal location of FACTS using several voltage stability analysis methods. For voltage stability assessment several methods have been introduced so far. Methods used for analysis are voltage stability indices (VSIs), voltage stability boundary (VSB) & modal analysis. In addition to suggested methods recent advertence has been issued to place FACTS devices at optimal location obtained by analysis for improving the voltage stability and reactive power compensation. Impacts of FACTS on VSBs have been studied to determine the most suitable FACTS at particular location. The critical values of voltage, active & reactive power have been evaluated and deviation in such parameters after compensation has been scrutinized to imply enhancement in voltage stability margin and verify optimal location of suggested FACTS.
URI: http://10.1.7.192:80/jspui/handle/123456789/8885
Appears in Collections:Dissertation, EE (EPS)

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