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http://10.1.7.192:80/jspui/handle/123456789/9361
Title: | Analog IP Validation and Automation |
Authors: | Sengunthar, Vani |
Keywords: | EC 2018 Project Report 2018 EC Project Report EC (Communication) Communication Communication 2018 18MECC 18MECC17 |
Issue Date: | 1-Jun-2020 |
Publisher: | Institute of Technology |
Series/Report no.: | 18MECC17; |
Abstract: | Background - Integrated Circuit development cycle involves a variety of sequential stages which are equally essential to its successful completion. Post-Silicon Validation is one such process which is aimed at verification of the IC’s performance at silicon level. Before shipping the device to customer it is important for test engineers to validate these Intellectual Properties (IP’s) to meet the design specifications across Process, Voltage and Temperature range. Here we deal with Silicon Validation of Analog IP’s such as Oscillators and Data Converters. Method- Silicon validation of Analog IP's calls for various tests to be performed such as Die Sorting, Power Consumption tests, Static and Dynamic Performance tests, Start up tests etc. Generally, an automated environment is used for all such measurements to minimize validation time and human error. Results - On test completion, validation report is generated. The performance of the IP at silicon level is compared with design specifications as well as CAD results for any deviations. The validation report helps determine the maturity of IC device and declares the validity of functionality of the device at different operating conditions. Conclusion – Silicon validation is a very important step of the IC development cycle and is carried out right before the chip is introduced in the market. In order to be sure that the device is fully complaint to design specifications, electrical validation is performed for all the Analog IP’s which are to be later embedded in SOC. Furthermore, the automation test run reduces considerable testing time and provides accuracy and speed and rules out human error. Several tools were used for the test environment such as test boards, testing instruments, LabVIEW software and GPIB protocol |
URI: | http://10.1.7.192:80/jspui/handle/123456789/9361 |
Appears in Collections: | Dissertation, EC (Communication) |
Files in This Item:
File | Description | Size | Format | |
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18MECC17.pdf | 18MECC17 | 1.39 MB | Adobe PDF | ![]() View/Open |
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