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dc.contributor.authorShah, Anshu-
dc.date.accessioned2020-09-30T10:02:24Z-
dc.date.available2020-09-30T10:02:24Z-
dc.date.issued2020-06-01-
dc.identifier.urihttp://10.1.7.192:80/jspui/handle/123456789/9364-
dc.description.abstractAs printed circuit boards (PCBs) has become more complex and denser, the need for exhaustive testing becomes extensively important. The IEEE 1149.1 Boundary Scan Architecture provides access to internal module network required for interconnect testing in situations where physical access is sparse or not possible. As the advantage of boundary scan was becoming recognized in many commercial applications, it became apparent that a universal definition was needed to achieve the economies of using as industry standard. This led to the 1990 approval of IEEE Standard 1149.1. It gives standardized approach to testing interconnection between integrated circuit, testing integrated circuit itself and observing and modifying circuit activity during component’s normal operation. Boundary Scan architecture tests pin connectivity without using physical test probes and captures functional data while a device is functioning normally. A set of test cases is defined, such that the component can respond to a set of instructions designed to support testing. Typical Boundary Scan testing involves manually generating bsdl file and test cases and then validating the model.This report describes the limitation of this method and suggests an alternate, automated ,efficient and faster approach to Boundary Scan testing validation.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries18MECE02;-
dc.subjectEC 2018en_US
dc.subjectProject Report 2018en_US
dc.subjectEC Project Reporten_US
dc.subjectEC (ES)en_US
dc.subjectEmbedded Systemsen_US
dc.subjectEmbedded Systems 2018en_US
dc.subject18MECen_US
dc.subject18MECEen_US
dc.subject18MECE02en_US
dc.titleBoundary Scan Validation For SoCen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EC (ES)

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