Please use this identifier to cite or link to this item:
http://10.1.7.192:80/jspui/handle/123456789/9373
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Parmar, Alex | - |
dc.date.accessioned | 2020-10-03T08:40:47Z | - |
dc.date.available | 2020-10-03T08:40:47Z | - |
dc.date.issued | 2020-06-01 | - |
dc.identifier.uri | http://10.1.7.192:80/jspui/handle/123456789/9373 | - |
dc.description.abstract | The Mass Spectrometer is widely used in the Pharmaceutical and Semiconductor Fabrication facility. The principal purpose concerning Mass Spectrometer is to measure the number of elements present in the gas chamber. Gas Chamber is the input of the device where the blend of gas, Atmospheric Air, Fab-lab vacuum chamber, and Pharmaceutical production line. ATONARP Mass Spectrometer has distinct form on electronics components, yet the pursuit of each components denes the accuracy of Spectrum. Those components are used in different kind of Electronics PCB boards, each board has a specific purpose. In AMS there are main 2 parts which are Controller Box and Power Entry Boards. Power Entry Boards consist Power entry Baseboard and Daughter boards 1 and 2, where Controller box consist RF Drive Board, Ion Drive Board, Ion Detector, Power Supply Board, Front panel Board and Baseboard. The functionality of every board shall be tested in the test case. The test case is developed on the basis of the functionality that the user wants in the device. There will be multiple features for different boards. Test case runs on each available system as well as on the Emulator, and the test case data is stored in the Master.log file. A script is developed to abstract the data from the Master.log file to the .csv file and the Key Performance Index is defined on the basis of that result. | en_US |
dc.publisher | Institute of Technology | en_US |
dc.relation.ispartofseries | 18MECE11; | - |
dc.subject | EC 2018 | en_US |
dc.subject | Project Report 2018 | en_US |
dc.subject | EC Project Report | en_US |
dc.subject | EC (ES) | en_US |
dc.subject | Embedded Systems | en_US |
dc.subject | Embedded Systems 2018 | en_US |
dc.subject | 18MEC | en_US |
dc.subject | 18MECE | en_US |
dc.subject | 18MECE11 | en_US |
dc.title | Automated Production Validation using Analytic | en_US |
dc.type | Dissertation | en_US |
Appears in Collections: | Dissertation, EC (ES) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
18MECE11.pdf | 18MECE11 | 3.29 MB | Adobe PDF | ![]() View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.