Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/1799
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dc.contributor.authorVora, Santosh C.-
dc.contributor.authorSatish, L.-
dc.date.accessioned2010-12-13T08:07:50Z-
dc.date.available2010-12-13T08:07:50Z-
dc.date.issued2004-12-27-
dc.identifier.citation13th National Power System Conference, NPSC 2004, IIT, Madras (Chennai), December 27-30, 2004, Page No. 878-883en
dc.identifier.urihttp://hdl.handle.net/123456789/1799-
dc.description.abstractTesting and calibration of high speed high - resolution digitizer (I. e. the ADC) used in HV impulse measurements is mandatory as per modern metrology, especially, in intercomparison and reference mesurements, where extremely high levels of accuracies are demaanded. Such testing services are, at the present moment, not being offered in country. Digitizer or oscilloscope manufacturers quete exorbitant prices for providing the same, as in most cases the equipment needs to be sent oversease, also there exists no national standard for such test. Despite this, HV labs in the country use digital impulse measuring systems and, so are compelled to undertake this costly exercise, on expire of the test certificate. This was the prime motivation.en
dc.relation.ispartofseriesITFEE007-7en
dc.subjectADCen
dc.subjectAnalog-to-Digital Converteren
dc.subjectIEEE 1057 and IEC 61083-1en
dc.subjectStatic and Dynamic Testingen
dc.subjectElectrical Faculty Paperen
dc.subjectFaculty Paperen
dc.subjectITFEE007en
dc.titleTesting ADCs used in High Speed High resolution Digital Waveform Recordersen
dc.typeFaculty Papersen
Appears in Collections:Faculty Papers, EE

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