IR @ Nirma University
Keeping in tune the global developments we are creating an institutional repository using DSpace Software (Digital Library Software). We are archiving institutional knowledge like, faculty papers, theses, and dissertations in PDF format at DSpace. Students can access this digital information anywhere in the campus.
Please use this identifier to cite or link to this item:
http://10.1.7.192:80/jspui/handle/123456789/3212| Title: | Analysis of Test Data Compression Methods Using Huffman Codes |
| Authors: | Bhavsar, Kinjal A. Mehta, Usha |
| Keywords: | EC Faculty Paper Faculty Paper ITFEC010 NUiCONE NUiCONE-2010 |
| Issue Date: | 9-Dec-2010 |
| Publisher: | Institute of Technology |
| Citation: | 1st International Conference on Current Trends in Technology, NUiCONE 2010, December 9-11, 2010, Institute of Technology, Nirma University, Ahmedabad |
| Series/Report no.: | ITFEC010-9 |
| Abstract: | This paper presents a compression scheme based on various Huffman coding like selective and optimal Huffman for reducing the amount of test data that must be stored on a tester and transferred to each core in a system-on-a-chip (SOC) during manufacturing test .Results indicate that the using Huffman coding compression ratio high but it required high hardware overhead .In selective Huffman coding reduces decoder size by slightly sacrificing compression ratio. In optimal selective maximize compression ratio |
| URI: | http://10.1.7.181:1900/jspui/123456789/3212 |
| Appears in Collections: | Faculty Papers, EC |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| ITFEC010-9.pdf | ITFEC010-9 | 228.75 kB | Adobe PDF |  View/Open |
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