Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/4729
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dc.contributor.authorVyas, Udit P.-
dc.date.accessioned2014-08-06T12:23:52Z-
dc.date.available2014-08-06T12:23:52Z-
dc.date.issued2014-06-01-
dc.identifier.urihttp://hdl.handle.net/123456789/4729-
dc.description.abstractThe amount of Analog circuits in the processor and chipset is continuously increasing due to implementation of complex interconnect protocols which operates at very high speeds. Analog validation of the design block is required for the design team to characterize the behavior of the circuits on the silicon and they should meet the specifcation. As the complexity of the design block increases, the number of tests to be done also increases. The automation of these tests is part of electrical validation and it will effectively reduce the time required in Validation phase of the Product Development Life-Cycle with reduced man power. In this project effort has been made to enhance the features of electrical validation for storage interfaces i.e. SD, eMMC with combination of python scripts and with prodigy software supported in Tektronix scope. Project includes timing parameters, signal integrity validation and system marginality validation for storage interfaces and also for the PLL and system clocks interfaces .en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries12MECV27;-
dc.subjectEC 2012en_US
dc.subjectProject Reporten_US
dc.subjectProject Report 2012en_US
dc.subjectEC Project Reporten_US
dc.subjectEC (VLSI)en_US
dc.subjectVLSIen_US
dc.subjectVLSI 2012en_US
dc.subject12MECen_US
dc.subject12MECVen_US
dc.subject12MECV27en_US
dc.titleElectrical Characterization Of Storage Interfaces In ATOM Based SOCsen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EC (VLSI)

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