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dc.contributor.authorPrajapati, Pinkeshkumar H.-
dc.date.accessioned2014-08-07T07:48:42Z-
dc.date.available2014-08-07T07:48:42Z-
dc.date.issued2014-06-01-
dc.identifier.urihttp://hdl.handle.net/123456789/4734-
dc.description.abstractRTL (register transfer level) integration is an important part of a VLSI design flow. It basically define the quality of the full chip system. Also in large CPU design, whole design are partitioned in different parts to reduce the complexity of the design and at the end all individual RTL logic are integrated to get full chip design. Thus for good quality and well featured chip we need to have a good quality RTL integration in our design. This can be achieved by having well defined FE (front end) methodology or flow. This report will give different FE flow example for different design or application and will explain in detail how we can modify the flow for getting better and verified RTL integration at the end. It will also demonstrate some example which will explain how proper FE methodology can reduce the initial bugs in the design. At the end will also explain the efficient, simple and much faster method for testing the system/tool functionality.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries12MECV22;-
dc.subjectEC 2012en_US
dc.subjectProject Reporten_US
dc.subjectProject Report 2012en_US
dc.subjectEC Project Reporten_US
dc.subjectEC (VLSI)en_US
dc.subjectVLSIen_US
dc.subjectVLSI 2012en_US
dc.subject12MECen_US
dc.subject12MECVen_US
dc.subject12MECV22en_US
dc.titleEffiecent Fe Methodology For Rtl Integration In Large CPU Designen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EC (VLSI)

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