Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/4743
Title: Verification Methodologies For Memory BIST
Authors: Parihar, Kunal
Keywords: EC 2012
Project Report
Project Report 2012
EC Project Report
EC (VLSI)
VLSI
VLSI 2012
12MEC
12MECV
12MECV13
Issue Date: 1-Jun-2014
Publisher: Institute of Technology
Series/Report no.: 12MECV13;
Abstract: The Project deals with functional verification of the MEMORY BIST and supported collar models and controller with an intent to verify all possible modes, application of all the tests by the BIST to ensure desired functionality. Our verification team is responsible for verification of collar and controller models of BIST for all types of memories such as SP-SRAM (Single Port SRAM), DP-RAM (Dual Port SRAM), ROM and BIST Controller as well as all types of supported architectures such as C28FDSOI and M40 NVM architectures. The aim of verification is to establish a common to all and stable verification environment /test bench which can serve to verify all possible configurations of Memory BIST collar and controller. The verification methodologies aim to provide a robust solution to testing and verifying the Memory BIST IP for its given specification covering maximum possible corner cases to deliver an efficient and completely working design.
URI: http://hdl.handle.net/123456789/4743
Appears in Collections:Dissertation, EC (VLSI)

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