Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/7336
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dc.contributor.authorDhare, Vaishali-
dc.contributor.authorMehta, Usha-
dc.date.accessioned2017-01-24T07:58:57Z-
dc.date.available2017-01-24T07:58:57Z-
dc.date.issued2015-06-26-
dc.identifier.citation19th International Symposium on VLSI Design and Test (VDAT), June 26 - 29, 2015en_US
dc.identifier.other10.1109/ISVDAT.2015.7208060 (DOI)-
dc.identifier.otherINSPEC Accession Number: 15383613-
dc.identifier.urihttp://hdl.handle.net/123456789/7336-
dc.description.abstractQCA (Quantum-dot Cellular Automata) is the promising future nanotechnology for computing. In QCA, the cells must be aligned properly at nano scales for proper functioning. Defects may occur in synthesis and deposition phase. So the defect analyses and testing cannot be ignored. This paper presents a survey on QCA basics, defect characterization and various testing aspects of QCA.en_US
dc.publisherIEEEen_US
dc.relation.ispartofseriesITFEC022-11;-
dc.subjectQuantum-Doten_US
dc.subjectQCAen_US
dc.subjectDefecten_US
dc.subjectTestingen_US
dc.subjectEC Faculty Paperen_US
dc.subjectFaculty Paperen_US
dc.subjectITFEC022en_US
dc.subjectITFEC010en_US
dc.titleDefect characterization and testing of QCA devices and circuits: A surveyen_US
dc.typeFaculty Papersen_US
Appears in Collections:Faculty Papers, EC

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