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DC Field | Value | Language |
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dc.contributor.author | Dhare, Vaishali | - |
dc.contributor.author | Mehta, Usha | - |
dc.date.accessioned | 2017-01-24T07:58:57Z | - |
dc.date.available | 2017-01-24T07:58:57Z | - |
dc.date.issued | 2015-06-26 | - |
dc.identifier.citation | 19th International Symposium on VLSI Design and Test (VDAT), June 26 - 29, 2015 | en_US |
dc.identifier.other | 10.1109/ISVDAT.2015.7208060 (DOI) | - |
dc.identifier.other | INSPEC Accession Number: 15383613 | - |
dc.identifier.uri | http://hdl.handle.net/123456789/7336 | - |
dc.description.abstract | QCA (Quantum-dot Cellular Automata) is the promising future nanotechnology for computing. In QCA, the cells must be aligned properly at nano scales for proper functioning. Defects may occur in synthesis and deposition phase. So the defect analyses and testing cannot be ignored. This paper presents a survey on QCA basics, defect characterization and various testing aspects of QCA. | en_US |
dc.publisher | IEEE | en_US |
dc.relation.ispartofseries | ITFEC022-11; | - |
dc.subject | Quantum-Dot | en_US |
dc.subject | QCA | en_US |
dc.subject | Defect | en_US |
dc.subject | Testing | en_US |
dc.subject | EC Faculty Paper | en_US |
dc.subject | Faculty Paper | en_US |
dc.subject | ITFEC022 | en_US |
dc.subject | ITFEC010 | en_US |
dc.title | Defect characterization and testing of QCA devices and circuits: A survey | en_US |
dc.type | Faculty Papers | en_US |
Appears in Collections: | Faculty Papers, EC |
Files in This Item:
File | Description | Size | Format | |
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ITFEC022-11.pdf | ITFEC022-11 | 304.51 kB | Adobe PDF | ![]() View/Open |
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