Defect Analysis Of Quantum-Dot Cellular Automata Combinational Circuit Using HDLQ

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DC Field	Value	Language
dc.contributor.author	Dhare, Vaishali	-
dc.contributor.author	Mehta, Usha	-
dc.date.accessioned	2017-01-24T08:15:57Z	-
dc.date.available	2017-01-24T08:15:57Z	-
dc.date.issued	2016-03	-
dc.identifier.issn	0976-6480 (print)	-
dc.identifier.issn	0976-6499 (Online)	-
dc.identifier.uri	http://hdl.handle.net/123456789/7337	-
dc.description	International Journal of Advanced Research in Engineering and Technology (IJARET), Vol. 7 (2), March - April, 2016, Page No. 148 - 158	en_US
dc.description.abstract	CMOS technology has achieved the device dimension in the nanometer range. Beyond this CMOS technology is the QCA (Quantum-dot Cellular Automata). Due to nanoscale defects may occur in this technology so in the consequences of it the faults will occur. This paper presents the defect analysis of QCA basic devices like Majority Voter (MV), inverter. The defect analysis and its effects on the output of combinational circuit using Hardware Description Language for QCA (HDLQ) is presented in this paper.	en_US
dc.publisher	IAEME Publication	en_US
dc.relation.ispartofseries	ITFEC022-12;	-
dc.subject	Quantum-Dot	en_US
dc.subject	QCA	en_US
dc.subject	Defect	en_US
dc.subject	HDLQ	en_US
dc.subject	EC Faculty Paper	en_US
dc.subject	Faculty Paper	en_US
dc.subject	ITFEC022	en_US
dc.subject	ITFEC010	en_US
dc.title	Defect Analysis Of Quantum-Dot Cellular Automata Combinational Circuit Using HDLQ	en_US
dc.type	Faculty Papers	en_US
Appears in Collections:	Faculty Papers, EC

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