IR @ Nirma University
Keeping in tune the global developments we are creating an institutional repository using DSpace Software (Digital Library Software). We are archiving institutional knowledge like, faculty papers, theses, and dissertations in PDF format at DSpace. Students can access this digital information anywhere in the campus.
Please use this identifier to cite or link to this item:
http://10.1.7.192:80/jspui/handle/123456789/737| Title: | Validation of Chips Containing Memories, I/Os and Standard Cells in nm Technology and Static IR Drop Analysis, Methodology for Testing and Characterization of Chips |
| Authors: | Thakur, Gunjan D. |
| Keywords: | EC 2005 Project Report 2005 EC Project Report Project Report 05MEC 05MEC020 VLSI VLSI 2005 |
| Issue Date: | 1-Jun-2007 |
| Publisher: | Institute of Technology |
| Series/Report no.: | 05MEC020 |
| Abstract: | Kindly look into the attachment |
| URI: | http://hdl.handle.net/123456789/737 |
| Appears in Collections: | Dissertation, EC (VLSI) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 05MEC020.pdf | 05MEC020 | 9.5 kB | Adobe PDF |  View/Open |
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