Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/7649
Title: Switching Losses Optimized IGBT Gate
Authors: Shah, Mitul K.
Keywords: Electrical 2017
Project Report 2017
Electrical Project Report
Project Report
EE (PEMD)
Power Electronics, Machines  & Drives
15MEE
15MEEP
15MEEP22
PEMD
PEMD 2017
Issue Date: May-2017
Publisher: Institute of Technology
Series/Report no.: 15MEEP22;
Abstract: In recent years, the increasing demands of an IGBT devices used in power electronic equipment due to their high power handling capability. IGBT devices play a large role in power applications due to their high current, voltage capability, and ease of driving. By increasing the switching speed it is possible to reduce the power dissipation, however, this, in turn, leads to fast current transitions that generate large amounts of electromagnetic interferences (EMI) over wide frequency ranges and increase over-current stress at turn-on, and over-voltage stress at turn-off. The challenge in gate driver design is to find solutions to the dilemma between the requirement to minimize switching losses and the requirement to limit electromagnetic interferences (EMI), peak reverse recovery current at turn-on, and voltage overshoot at turn-off.
URI: http://hdl.handle.net/123456789/7649
Appears in Collections:Dissertation, EE (PEMD)

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