Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/8845
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dc.contributor.authorDave, Prachi-
dc.date.accessioned2019-09-04T08:39:30Z-
dc.date.available2019-09-04T08:39:30Z-
dc.date.issued2018-06-01-
dc.identifier.urihttp://10.1.7.192:80/jspui/handle/123456789/8845-
dc.description.abstractModern ASIC designs having ultra-deep sub-micron processes, for this type of technology node layout had very important role to play. Full chip layout had its own hierarchical structure. The full chip hierarchy contains Standard cell, Functional unit blocks (fub), Section. Fub Integration Flow is useful to integrate the fub inside section. It basically loads all the fub data inside section, then perform hook power on it and check for the opens, DRC violations, design for manufacturability, etc.Sections have many fub to integrate in cyclic manner and have many DRCs violation over the fubs. To clean all the DRC violations manually is time consuming process, so automated flow is being proposed which can fix DRCs and saves the time. Automated flow will fix all the DRC listed down in the violation table, which can reduce manual human efforts in cleaning DRCs.en_US
dc.publisherInstitute of Technologyen_US
dc.relation.ispartofseries16MECV04;-
dc.subjectEC 2016en_US
dc.subjectProject Reporten_US
dc.subjectProject Report 2016en_US
dc.subjectEC Project Reporten_US
dc.subjectEC (VLSI)en_US
dc.subjectVLSIen_US
dc.subjectVLSI 2016en_US
dc.subject16MECen_US
dc.subject16MECVen_US
dc.subject16MECV04en_US
dc.titleAutomated Flow to fix Semi-custom Layout DRC in Ultra-Deep-Submicron Technologyen_US
dc.typeDissertationen_US
Appears in Collections:Dissertation, EC (VLSI)

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