Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/8845
Title: Automated Flow to fix Semi-custom Layout DRC in Ultra-Deep-Submicron Technology
Authors: Dave, Prachi
Keywords: EC 2016
Project Report
Project Report 2016
EC Project Report
EC (VLSI)
VLSI
VLSI 2016
16MEC
16MECV
16MECV04
Issue Date: 1-Jun-2018
Publisher: Institute of Technology
Series/Report no.: 16MECV04;
Abstract: Modern ASIC designs having ultra-deep sub-micron processes, for this type of technology node layout had very important role to play. Full chip layout had its own hierarchical structure. The full chip hierarchy contains Standard cell, Functional unit blocks (fub), Section. Fub Integration Flow is useful to integrate the fub inside section. It basically loads all the fub data inside section, then perform hook power on it and check for the opens, DRC violations, design for manufacturability, etc.Sections have many fub to integrate in cyclic manner and have many DRCs violation over the fubs. To clean all the DRC violations manually is time consuming process, so automated flow is being proposed which can fix DRCs and saves the time. Automated flow will fix all the DRC listed down in the violation table, which can reduce manual human efforts in cleaning DRCs.
URI: http://10.1.7.192:80/jspui/handle/123456789/8845
Appears in Collections:Dissertation, EC (VLSI)

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