Please use this identifier to cite or link to this item: http://10.1.7.192:80/jspui/handle/123456789/9364
Title: Boundary Scan Validation For SoC
Authors: Shah, Anshu
Keywords: EC 2018
Project Report 2018
EC Project Report
EC (ES)
Embedded Systems
Embedded Systems 2018
18MEC
18MECE
18MECE02
Issue Date: 1-Jun-2020
Publisher: Institute of Technology
Series/Report no.: 18MECE02;
Abstract: As printed circuit boards (PCBs) has become more complex and denser, the need for exhaustive testing becomes extensively important. The IEEE 1149.1 Boundary Scan Architecture provides access to internal module network required for interconnect testing in situations where physical access is sparse or not possible. As the advantage of boundary scan was becoming recognized in many commercial applications, it became apparent that a universal definition was needed to achieve the economies of using as industry standard. This led to the 1990 approval of IEEE Standard 1149.1. It gives standardized approach to testing interconnection between integrated circuit, testing integrated circuit itself and observing and modifying circuit activity during component’s normal operation. Boundary Scan architecture tests pin connectivity without using physical test probes and captures functional data while a device is functioning normally. A set of test cases is defined, such that the component can respond to a set of instructions designed to support testing. Typical Boundary Scan testing involves manually generating bsdl file and test cases and then validating the model.This report describes the limitation of this method and suggests an alternate, automated ,efficient and faster approach to Boundary Scan testing validation.
URI: http://10.1.7.192:80/jspui/handle/123456789/9364
Appears in Collections:Dissertation, EC (ES)

Files in This Item:
File Description SizeFormat 
18MECE02.pdf18MECE021.92 MBAdobe PDFThumbnail
View/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.