IR @ Nirma University
Keeping in tune the global developments we are creating an institutional repository using DSpace Software (Digital Library Software). We are archiving institutional knowledge like, faculty papers, theses, and dissertations in PDF format at DSpace. Students can access this digital information anywhere in the campus.
Please use this identifier to cite or link to this item:
http://10.1.7.192:80/jspui/handle/123456789/7336| Title: | Defect characterization and testing of QCA devices and circuits: A survey |
| Authors: | Dhare, Vaishali Mehta, Usha |
| Keywords: | Quantum-Dot QCA Defect Testing EC Faculty Paper Faculty Paper ITFEC022 ITFEC010 |
| Issue Date: | 26-Jun-2015 |
| Publisher: | IEEE |
| Citation: | 19th International Symposium on VLSI Design and Test (VDAT), June 26 - 29, 2015 |
| Series/Report no.: | ITFEC022-11; |
| Abstract: | QCA (Quantum-dot Cellular Automata) is the promising future nanotechnology for computing. In QCA, the cells must be aligned properly at nano scales for proper functioning. Defects may occur in synthesis and deposition phase. So the defect analyses and testing cannot be ignored. This paper presents a survey on QCA basics, defect characterization and various testing aspects of QCA. |
| URI: | http://hdl.handle.net/123456789/7336 |
| Appears in Collections: | Faculty Papers, EC |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| ITFEC022-11.pdf | ITFEC022-11 | 304.51 kB | Adobe PDF |  View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.