IR @ Nirma University
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http://10.1.7.192:80/jspui/handle/123456789/7337| Title: | Defect Analysis Of Quantum-Dot Cellular Automata Combinational Circuit Using HDLQ |
| Authors: | Dhare, Vaishali Mehta, Usha |
| Keywords: | Quantum-Dot QCA Defect HDLQ EC Faculty Paper Faculty Paper ITFEC022 ITFEC010 |
| Issue Date: | Mar-2016 |
| Publisher: | IAEME Publication |
| Series/Report no.: | ITFEC022-12; |
| Abstract: | CMOS technology has achieved the device dimension in the nanometer range. Beyond this CMOS technology is the QCA (Quantum-dot Cellular Automata). Due to nanoscale defects may occur in this technology so in the consequences of it the faults will occur. This paper presents the defect analysis of QCA basic devices like Majority Voter (MV), inverter. The defect analysis and its effects on the output of combinational circuit using Hardware Description Language for QCA (HDLQ) is presented in this paper. |
| Description: | International Journal of Advanced Research in Engineering and Technology (IJARET), Vol. 7 (2), March - April, 2016, Page No. 148 - 158 |
| URI: | http://hdl.handle.net/123456789/7337 |
| ISSN: | 0976-6480 (print) 0976-6499 (Online) |
| Appears in Collections: | Faculty Papers, EC |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| ITFEC022-12.pdf | ITFEC022-12 | 519.81 kB | Adobe PDF |  View/Open |
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